Effects of Composition and Processing on the Properties of Sn-3Zn-4Bi and Sn-Ag-Cu Solder Alloys for Electronic Packaging
Main Article Content
Abstract
The mechanical properties of lead-free solder alloys are critical for ensuring the reliability of electronic packaging, with shear strength and hardness being particularly important as electronic devices become smaller and interconnection densities increase. Thermal fluctuations and external mechanical impacts further intensify shear stresses on solder joints, raising concerns about long-term performance. In this study, the shear stress behavior of Sn-Ag-Cu and Sn-3Zn-4Bi solder joints was examined under different reflow temperatures. Sn-Ag-Cu, a widely researched lead-free solder, demonstrated strong resistance to high stress levels, reinforcing its suitability for high-reliability applications; however, its relatively high melting temperature (~221 °C) limits its use in low-temperature reflow processes. By comparison, Sn-3Zn-4Bi solder, with a melting temperature only ~12 °C higher than eutectic SnPb solder, showed potential for low-temperature soldering, while also exhibiting higher microhardness values than Sn-Ag-Cu, suggesting improved structural robustness. Despite these advantages, concerns remain regarding its compatibility with copper substrates, where interfacial reactions may affect joint integrity. Overall, the results suggest that Sn-Ag-Cu is preferable for applications requiring high strength and thermal resistance, whereas Sn-3Zn-4Bi offers notable benefits for low-temperature processing, provided substrate interactions are properly managed.
Manuscript received: 15 Aug 2025 | Revised: 30 Sep 2025 | Accepted: 4 Oct 2025 | Published: 30 Nov 2025
Article Details

This work is licensed under a Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International License.
References
M. Abtew and G. Selvaduray, “Lead-free Solders in Microelectronics,” Materials Science and Engineering: R: Reports, vol. 27, no. 5–6, pp. 95–141, 2000.
DOI: https://doi.org/10.1016/S0927-796X(00)00010-3
K. Suganuma, “Advances in lead-free electronics soldering,” Current Opinion in Solid State and Materials Science, vol. 5, no. 1, pp. 55–64, 2001.
DOI: https://doi.org/10.1016/S1359-0286(00)00036-X
W. Chen, S. Xue, H. Wang and Y. Hu, “Effects of Ag on Properties of Sn-9Zn Lead-Free Solder,” Rare Metal Materials and Engineering, vol. 39, no. 10, pp. 1702–1706, 2010.
DOI: https://doi.org/10.1016/S1875-5372(10)60127-0
M.D. Mathew, H. Yang, S. Movva and K.L. Murty, “Creep deformation characteristics of tin and tin-based electronic solder alloys,” Metallurgical and Materials Transactions A, vol. 36, no. 1, pp. 99–105, 2005.
DOI: https://doi.org/10.1007/s11661-005-0142-z
C. Kanchanomai, Y. Miyashita and Y. Mutoh, “Strain-rate effects on low cycle fatigue mechanism of eutectic Sn–Pb solder,” International Journal of Fatigue, vol. 24, no. 9, pp. 987–993, 2002.
DOI: https://doi.org/10.1016/S0142-1123(02)00011-7
D. Li, P.P. Conway and C. Liu, “Corrosion characterization of tin–lead and lead free solders in 3.5wt.% NaCl solution,” Corrosion Science, vol. 50, no. 4, pp. 995–1004, 2008.
DOI: https://doi.org/10.1016/j.corsci.2007.11.025
B.L. Chen and G.Y. Li, “Influence of Sb on IMC growth in Sn–Ag–Cu–Sb Pb-free solder joints in reflow process,” Thin Solid Films, vol. 462–463, pp. 395–401, 2004.
DOI: https://doi.org/10.1016/j.tsf.2004.05.063
EPoC, “Directive 2002/95/EC of the European Parliament and of the Council of 27 January 2003 on the restriction of the use of certain hazardous substances in electrical and electronic equipment,” Official Journal, vol. 37, pp. 19-23, 2003.
URL: https://eur-lex.europa.eu/eli/dir/2002/95/oj
J. Webster, J. Pan and B.J. Toleno, “Investigation of the Lead-free Solder Joint Shear Performance,” Journal of Microelectronics and Electronic Packaging, vol. 4, no. 2, pp. 72–77, 2007.
DOI: https://doi.org/10.4071/1551-4897-4.2.72
J. Zhou, Y. Sun and F. Xue, “Properties of low melting point Sn–Zn–Bi solders,” Journal of Alloys and Compounds, vol. 397, no. 1–2, pp. 260–264, 2005.
DOI: https://doi.org/10.1016/j.jallcom.2004.12.052
B.-I. Noh, J.-H. Choi, J.-W. Yoon and S.-B. Jung, “Effects of cerium content on wettability, microstructure and mechanical properties of Sn–Ag–Ce solder alloys,” Journal of Alloys and Compounds, vol. 499, no. 2, pp. 154–159, 2010.
DOI: https://doi.org/10.1016/j.jallcom.2010.03.179
A.Z. Miric and A. Grusd, “Lead-free alloys,” Soldering & Surface Mount Technology, vol. 10, no. 1, pp. 19–25, 1998.
DOI: https://doi.org/10.1108/09540919810203793
F.Hua, J. Glazer and F.L. Orlando, “Lead-free solders for electronic assembly,” Proceedings of TMS Symposium on Design and reliability of solder interconnects, pp. 65–73, 1997.
URL: https://cir.nii.ac.jp/crid/1573387450381260288
L. Jeyeselan and E.E. Mhd Noor, “Effects of Electromigration on Sn-Bi Lead-Free Solder Alloy Joints on Copper and Copper with Nickel Surface Finish,” Materials, vol. 18, no. 16, pp. 3722, 2025.
DOI: https://doi.org/10.3390/ma18163722
T.T. Dele-Afolabi, M.N.M. Ansari, M.A.A. Hanim, A.A. Oyekanmi, O.J. Ojo-Kupoluyi and A. Atiqah, “Recent advances in Sn-based lead-free solder interconnects for microelectronics packaging: Materials and technologies,” Journal of Materials Research and Technology, vol. 25, pp. 4231–4263, 2023.
DOI: https://doi.org/10.1016/j.jmrt.2023.06.193
C. Qiao, S. Qiao, Q. Wu, T. Chowwanonthapunya, C. Dai, Y. Shen and L. Hao, “A new understanding on the corrosion failure of Sn-based lead-free solder through the EIS monitoring and interpretation,” Corrosion Communications, 2025.
DOI: https://doi.org/10.1016/j.corcom.2025.02.001
P. Chockalingam, L. Perumal and G. Krishnan, “Characterization and Evaluation of Mechanical Properties of Carbon Nanotube Filler Epoxy Composite,” International Journal on Robotics, Automation and Sciences, vol. 6, no. 1, pp. 1–5, 2024.
DOI: https://doi.org/10.33093/ijoras.2024.6.1.1
A. Kar, M. Ghosh, R.N. Ghosh, B.S. Majumdar and A.K. Ray, “Evolution of mechanical and electrical properties of tin–lead and lead free solder to copper joint interface,” Materials Letters, vol. 62, no. 1, pp. 151–154, 2008.
DOI: https://doi.org/10.1016/j.matlet.2007.04.116
R.L.J.M. Ubachs, P.J.G. Schreurs and M.G.D. Geers, “A nonlocal diffuse interface model for microstructure evolution of tin–lead solder,” Journal of the Mechanics and Physics of Solids, vol. 52, no. 8, pp. 1763–1792, 2004.
DOI: https://doi.org/10.1016/j.jmps.2004.02.002
J.-W. Kim and S.-B. Jung, “Reexamination of the solder ball shear test for evaluation of the mechanical joint strength,” International Journal of Solids and Structures, vol. 43, no. 7–8, pp. 1928–1945, 2006.
DOI: https://doi.org/10.1016/j.ijsolstr.2005.07.014
C.J. Thwaites, “Soldering technology — decade of developments,” International Metals Reviews, vol. 29, no. 1, pp. 45–74, 1984.
DOI: https://doi.org/10.1179/imtr.1984.29.1.45
E.E.M. Noor, N.M. Sharif, C.K. Yew, T. Ariga, A.B. Ismail and Z. Hussain, “Wettability and strength of In–Bi–Sn lead-free solder alloy on copper substrate,” Journal of Alloys and Compounds, vol. 507, no. 1, pp. 290–296, 2010.
DOI: https://doi.org/10.1016/j.jallcom.2010.07.182
S.E.A. Negm, A.S.A. Moghny and S.I. Ahmad, “Investigation of thermal and mechanical properties of Sn-Zn and Sn-Zn- Bi near-eutectic solder alloys,” Results in Materials, vol. 15, pp. 100316, 2022.
DOI: https://doi.org/10.1016/j.rinma.2022.100316
E.E.M. Noor, A.B. Ismail, N.M. Sharif, T. Ariga and Z. Hussain, “Characteristic of low temperature of Bi-In-Sn solder alloy,” 2008 33rd IEEE/CPMT International Electronics Manufacturing Technology Conference (IEMT), pp. 1–4, 2008.
DOI: https://doi.org/10.1109/IEMT.2008.5507865
J. Chriastelova and M. Ozvold, “Properties of solders with low melting point,” Journal of Alloys and Compounds, vol. 457, no. 1–2, pp. 323–328, 2008.
DOI: https://doi.org/10.1016/j.jallcom.2007.03.062
H.-T. Lee, H.-S. Lin, C.-S. Lee and P.-W. Chen, “Reliability of Sn–Ag–Sb lead-free solder joints,” Materials Science and Engineering: A, vol. 407, no. 1–2, pp. 36–44, 2005.
DOI: https://doi.org/10.1016/j.msea.2005.07.049
G. Li, Y. Shi, H. Hao, Z. Xia, Y. Lei and F. Guo, “Effect of phosphorus element on the comprehensive properties of Sn–Cu lead-free solder,” Journal of Alloys and Compounds, vol. 491, no. 1–2, pp. 382–385, 2010.
DOI: https://doi.org/10.1016/j.jallcom.2009.10.190
X.J. Wang, Q.L. Zeng, Q.S. Zhu, Z.G. Wang and J.K. Shang, “Effects of Current Stressing on Shear Properties of Sn-3.8Ag-0.7Cu Solder Joints,” Journal of Materials Science & Technology, vol. 26, no. 8, pp. 737–742, 2010.
DOI: https://doi.org/10.1016/S1005-0302(10)60116-8
J.J. Sundelin, S.T. Nurmi, T.K. Lepistö and E.O. Ristolainen, “Mechanical and microstructural properties of SnAgCu solder joints,” Materials Science and Engineering: A, vol. 420, no. 1–2, pp. 55–62, 2006.
DOI: https://doi.org/10.1016/j.msea.2006.01.065
J. Keller, D. Baither, U. Wilke, and G. Schmitz, “Mechanical properties of Pb-free SnAg solder joints,” Acta Materialia, vol. 59, no. 7, pp. 2731–2741, 2011.
DOI: https://doi.org/10.1016/j.actamat.2011.01.012
R. Mayappan, A.B. Ismail, Z.A. Ahmad, T. Ariga and L.B. Hussain, “The effect of crosshead speed on the joint strength between Sn-Zn-Bi lead-free solders and Cu substrate,” Journal of Alloys and Compounds, vol. 436, no. 1–2, pp. 112–117, 2007.
DOI: https://doi.org/10.1016/j.jallcom.2006.07.035
IXYS, “Lead Free Solder Reflow for Semiconductor Power Devices,” EDN, 2014.
URL: https://www.edn.com/lead-free-solder-reflow-for-semiconductor-power-devices/
T. Fouzder, A.K. Gain, Y.C. Chan, A. Sharif and W.K.C. Yung, “Effect of nano Al2O3 additions on the microstructure, hardness and shear strength of eutectic Sn–9Zn solder on Au/Ni metallized Cu pads,” Microelectronics Reliability, vol. 50, no. 12, pp. 2051–2058, 2010.
DOI: https://doi.org/10.1016/j.microrel.2010.06.013
J.Y.H. Chia, B. Cotterell and A.Y.H. Cheong, “The specific work of fracture in ball shear test and the integrity of solder balls,” Materials Science and Engineering: A, vol. 428, no. 1–2, pp. 67–72, 2006.
DOI: https://doi.org/10.1016/j.msea.2006.04.052
S.-H. Wang, T.-S. Chin, C.-F. Yang, S.-W. Chen and C.-T. Chuang, “Pb-free solder-alloy based on Sn–Zn–Bi with the addition of germanium,” Journal of Alloys and Compounds, vol. 497, no. 1–2, pp. 428–431, 2010.
DOI: https://doi.org/10.1016/j.jallcom.2010.03.094
G. Li and X. Shi, “Effects of bismuth on growth of intermetallic compounds in Sn-Ag-Cu Pb-free solder joints,” Transactions of Nonferrous Metals Society of China, vol. 16, pp. s739–s743, 2006.
DOI: https://doi.org/10.1016/S1003-6326(06)60292-6
K.N. Prabhu, P. Deshapande, and Satyanarayan, “Effect of cooling rate during solidification of Sn–9Zn lead-free solder alloy on its microstructure, tensile strength and ductile–brittle transition temperature,” Materials Science and Engineering: A, vol. 533, pp. 64–70, 2012.
DOI: https://doi.org/10.1016/j.msea.2011.11.035
L. Gao, S. Xue, L. Zhang, Z. Sheng, G. Zeng and F. Ji, “Effects of trace rare earth Nd addition on microstructure and properties of SnAgCu solder,” Journal of Materials Science: Materials in Electronics, vol. 21, no. 7, pp. 643–648, 2010.
DOI: https://doi.org/10.1007/s10854-009-9970-8
R. Mayappan, A.B. Ismail, Z.A. Ahmad, T. Ariga and L.B. Hussain, “Effect of sample perimeter and temperature on Sn–Zn based lead-free solders,” Materials Letters, vol. 60, no. 19, pp. 2383–2389, 2006.
DOI: https://doi.org/10.1016/j.matlet.2006.01.024
D. Yang and Y. Huang, “Interfacial intermetallic compound modification to extend the electromigration lifetime of copper pillar joints,” Frontiers in Materials, vol. 9, 2023.
DOI: https://doi.org/10.3389/fmats.2022.1080848
Q. Yu, T. Shibutani, D.-S. Kim, Y. Kobayashi, J. Yang and M. Shiratori, “Effect of process-induced voids on isothermal fatigue resistance of CSP lead-free solder joints,” Microelectronics Reliability, vol. 48, no. 3, pp. 431–437, 2008.
DOI: https://doi.org/10.1016/j.microrel.2007.08.008
Y. Yang, H. Lu, C. Yu and Y. Li, “Void formation at the interface in Sn/Cu solder joints,” Microelectronics Reliability, vol. 51, no. 12, pp. 2314–2318, 2011.
DOI: https://doi.org/10.1016/j.microrel.2011.06.026
C.-W. Hwang and K. Suganuma, “Joint reliability and high temperature stability of Sn–Ag–Bi lead-free solder with Cu and Sn–Pb/Ni/Cu substrates,” Materials Science and Engineering: A, vol. 373, no. 1–2, pp. 187–194, 2004.
DOI: https://doi.org/10.1016/j.msea.2004.01.019
Y. Yang, H. Lu, C. Yu and Y. Li, “Void formation at the interface in Sn/Cu solder joints,” Microelectronics Reliability, vol. 51, no. 12, pp. 2314–2318, 2011.
DOI: https://doi.org/10.1016/j.microrel.2011.06.026
J.M. Lin, Z.W. Yang, H.H. Wei, Y. Wang, Z.Q. Ma and D.P. Wang, “An investigation on diffusion bonding of TZM alloy and Nb-Zr alloy using Ni foil as an interlayer,” Journal of Alloys and Compounds, vol. 743, pp. 780–788, 2018.