Optical and Structural Properties of V2O5 Electrochromic Thin Films Manuscript Received: 15 April 2024, Accepted: 31 May 2024, Published: 15 September2024, ORCiD: 0000-0003-1076-5034, https://doi.org/10.33093/jetap.2024.6.2.11

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Article
Published: Sep 15, 2024
DOI: https://doi.org/10.33093/jetap.2024.6.2.11
Keywords:
Electrochromic, Sol-gel, V2O5, Thin film, Multicolor

Main Article Content

Ming Yue Tan
Centre for Advanced Devices and Systems, Faculty of Engineering, Multimedia University, Cyberjaya, Malaysia.
Kah Yoong Chan
Centre for Advanced Devices and Systems, Faculty of Engineering, Multimedia University, Cyberjaya, Malaysia.
Gregory Soon How Thien
Centre for Advanced Devices and Systems, Faculty of Engineering, Multimedia University, Cyberjaya, Malaysia.
Kar Ban Tan
Department of Chemistry, Faculty of Science, Universiti Putra Malaysia, Serdang, Malaysia.
H. C. Ananda Murthy
Department of Prosthodontics, Saveetha Dental College & Hospital, Saveetha Institute of Medical and Technical Science, Saveetha University, Tamil Nadu, India.
Benedict Wen Chen Au
Sri Desa International School, Kuala Lumpur, Malaysia.

Abstract

The increase in global temperature has led to a significant surge in energy consumption within the air conditioning industry, resulting in environmental deterioration. Electrochromic (EC) windows have emerged as a promising solution to address these challenges. Vanadium pentoxide (V2O5) stands out among all metal oxide materials due to its remarkable EC properties, including substantial Li+ ion insertion capacity and multicolor capabilities. Despite the potential of V2O5, there remains a lack of comprehensive research on the structural and optical properties of V2O5 films with varying thicknesses. Therefore, this study aims to investigate the structural and optical properties of V2O5 thin films with thicknesses ranging from 46 to 344 nm. By employing the sol-gel spin coating method, V2O5 thin films were fabricated and analyzed using X-ray diffraction (XRD) spectroscopy and ultraviolet-visible (UV-Vis) spectrophotometry. The fabricated V2O5 thin films with thicknesses of 46-274 nm demonstrated an average film transparency of 83 %. XRD analysis further revealed that the V2O5 thin films reached their peak crystallinity at a thickness of 344 nm. Moreover, CV analysis revealed that the V2O5 device, with a thickness of 274 nm, exhibited a cathodic peak current of -1.63 mA, indicating its excellent ability to facilitate Li+ ion diffusion. Additionally, CA measurements displayed a high optical modulation of 37.78 %. Ultimately, this research contributes to the development of energy-efficient solutions for sustainable environmental practices.

Article Details

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Vol. 6 No. 2 (2024): https://doi.org/10.33093/jetap.2024.6.2
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